Looking at the nanoscale: Scanning near-field optical microscopy

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Author(s) De Serio, M., Zenobi, Renato, Deckert, Volker
Publication Type Journal Items, Publication Status: Published
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Title Looking at the nanoscale: Scanning near-field optical microscopy
Author(s) De Serio, M.
Zenobi, Renato
Deckert, Volker
Journal or Series Title TRAC
Volume Number 22
Issue Number 2
Start Page 70
End Page 77
ISSN 0165-9936
Publication Date 2003-02
Abstract Understanding physical phenomena at the molecular or even atomic level, comprehending exchange processes in the cells, and storing an increasing amount of data in smaller space are all fields of research that require technology not on the micrometer but on the nanometer scale. Among these emerging techniques, we will focus on scanning near-field optical microscopy (SNOM). We will explain its principles and its application in research.
DOI 10.1016/S0165-9936(03)00201-2
Additional Notes Available online 6 March 2003
Document Type Article
Publication Status Published
Language English
NEBIS System Number 000011729
Source Database ID WOS-000181584600019
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  author = "De Serio, M. and Zenobi, Renato and Deckert, Volker",
  title = "{L}ooking at the nanoscale: {S}canning near-field optical microscopy",
  journal = "TRAC",
  year = 2003,
  volume = "22",
  number = "2",
  pages = "70--77",
  month = feb,

E-Citations record created: Fri, 02 Nov 2012, 10:00:20 CET