Nanoscale Chemical Imaging of Single-Layer Graphene

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Author(s) Stadler, Johannes, Schmid, Thomas, Zenobi, Renato
Publication Type Journal Items, Publication Status: Published
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Title Nanoscale Chemical Imaging of Single-Layer Graphene
Author(s) Stadler, Johannes
Schmid, Thomas
Zenobi, Renato
Journal or Series Title Acs Nano
Volume Number 5
Issue Number 10
Start Page 8442
End Page 8448
ISSN 1936-0851
1936-086X
Publisher American Chemical Society
Publication Place Columbus, OH
Publication Date 2011
Keyword(s) Single-layer graphene
Tip-enhanced Raman spectroscopy
Confocal Raman microscopy
Abstract Electronic properties in different graphene materials are Influenced by the presence of defects and their relative position with respect to the edges. Their localization is crucial for the reliable development of graphene-based electronic devices. Graphene samples produced by standard CVD on copper and by the scotch-tape method on gold were investigated using tip-enhanced Raman spectroscopy (TEE). A resolution of <12 nm is reached using TERS imaging with full spectral information in every pixel. TERS is shown to be capable of Identifying defects, contaminants, and pristine graphene due to their different spectroscopic signatures, and of performing chemical imaging. TERS allows the detection of smaller defects than visible by confocal Raman microscopy and a far more precise localization. Consecutive scans on the same sample area show the reproducibility of the measurements, as well as the ability to zoom in from an overview scan onto specific sample features. TERS images can be acquired in as few as 5 min with 32 x 32 pixels. Compared to confocal Raman microscopy, a high sensitivity for defects, edges, hydrogen-terminated areas or contaminated areas (in general for deviations from the two-dimensional structure of pristine graphene) is obtained due to selective enhancement as a consequence of the orientation in the electromagnetic field.
DOI 10.1021/nn2035523
Additional Notes Published online 29 September 2011
Document Type Article
Publication Status Published
Language English
Assigned Organisational Unit(s) 03430
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NEBIS System Number 005422099
Source Database ID WOS-000296208700103
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@article{Stdlr2011,
  author = "Stadler, Johannes and Schmid, Thomas and Zenobi, Renato",
  title = "{N}anoscale {C}hemical {I}maging of {S}ingle-{L}ayer {G}raphene",
  journal = "Acs Nano",
  year = 2011,
  volume = "5",
  number = "10",
  pages = "8442--8448",
}


E-Citations record created: Mon, 21 Nov 2011, 07:25:29 CET