Microstructural Changes of Vacuum Interrupter Contact Materials Caused by Switching Operations
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Date
2010Type
- Conference Paper
ETH Bibliography
yes
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Publication status
publishedExternal links
Journal / series
Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (HOLM), 2010 : 4 - 7 Oct. 2010, Charleston, SC, USA ; [jointly with] the 25th International Conference on Electrical Contacts (ICEC)Publisher
IEEEEvent
Subject
Vacuum interrupter; Contact material; Vacuum arc; Microstructure; Copper chromium; Splat-quenching; Melt-spinningOrganisational unit
03661 - Löffler, Jörg F. / Löffler, Jörg F.
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ETH Bibliography
yes
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